afm-spm-analyzer

AFM-SPM Analyzer

Purpose

The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements.

Capabilities

• Topography imaging and analysis
• Surface roughness calculation (Ra, RMS)
• Force-distance curve analysis
• Nanoindentation and mechanical mapping
• Kelvin probe force microscopy (KPFM)
• Conductive AFM measurements

Usage Guidelines

AFM Analysis Workflow

1. Topography Analysis
2. Apply plane leveling corrections
3. Remove artifacts and noise
4. Calculate roughness parameters

1. Mechanical Mapping
2. Calibrate cantilever spring constant
3. Apply contact mechanics models
4. Generate modulus maps

1. Electrical Measurements
2. Calibrate work function reference
3. Map surface potential
4. Measure local conductivity

Process Integration

• Multi-Modal Nanomaterial Characterization Pipeline
• In-Situ Characterization Experiment Design
• Thin Film Deposition Process Optimization

Input Schema

{
  "data_file": "string",
  "analysis_type": "topography|force_curves|mechanical|electrical",
  "cantilever_specs": {
    "spring_constant": "number (N/m)",
    "tip_radius": "number (nm)"
  }
}

Output Schema

{
  "topography": {
    "Ra": "number (nm)",
    "RMS": "number (nm)",
    "Rmax": "number (nm)",
    "image_path": "string"
  },
  "mechanical": {
    "modulus": "number (GPa)",
    "adhesion": "number (nN)",
    "deformation": "number (nm)"
  },
  "electrical": {
    "surface_potential": "number (mV)",
    "work_function": "number (eV)"
  }
}