STM Analyzer
Purpose
The STM Analyzer skill provides atomic-resolution surface analysis through scanning tunneling microscopy, enabling visualization of atomic structures and measurement of local electronic properties.
Capabilities
- Atomic-resolution imaging
- STS (Scanning Tunneling Spectroscopy)
- Local density of states mapping
- Surface reconstruction analysis
- Molecular imaging
- Low-temperature operation protocols
Usage Guidelines
STM Analysis
- Imaging
- Optimize tunneling parameters
- Apply drift correction
- Identify atomic features
- Spectroscopy
- Acquire dI/dV spectra
- Map electronic states
- Identify band structure features
- Data Processing
- Apply Fourier filtering
- Correct for thermal drift
- Calibrate atomic distances
Process Integration
- In-Situ Characterization Experiment Design
- Structure-Property Correlation Analysis
Input Schema
{
"data_file": "string",
"analysis_type": "imaging|spectroscopy|sts_mapping",
"bias_voltage": "number (V)",
"setpoint_current": "number (nA)"
}Output Schema
{
"imaging": {
"atomic_structure": "string",
"lattice_constant": "number (nm)",
"defects_identified": ["string"]
},
"spectroscopy": {
"band_gap": "number (eV)",
"fermi_level": "number (eV)",
"density_of_states": {"energy": [], "dos": []}
}
}