tof-sims-analyzer

ToF-SIMS Analyzer

Purpose

The ToF-SIMS Analyzer skill provides molecular-level surface analysis capabilities for nanomaterials, enabling identification of surface species, chemical imaging, and depth profiling with high sensitivity.

Capabilities

• Molecular ion identification
• Surface contamination analysis
• 2D and 3D chemical imaging
• Isotope labeling detection
• Depth profiling
• Principal component analysis of spectra

Usage Guidelines

ToF-SIMS Analysis

1. Spectral Analysis
2. Identify characteristic fragments
3. Build peak lists for materials
4. Apply multivariate analysis

1. Imaging Mode
2. Optimize spatial resolution
3. Generate chemical maps
4. Correlate with topography

1. Depth Profiling
2. Select appropriate sputter source
3. Monitor interface sharpness
4. Account for matrix effects

Process Integration

• Multi-Modal Nanomaterial Characterization Pipeline
• Nanomaterial Surface Functionalization Pipeline

Input Schema

{
  "sample_id": "string",
  "analysis_mode": "spectral|imaging|depth_profile",
  "primary_ion": "Bi3+|Bi1+|C60+",
  "polarity": "positive|negative",
  "area_of_interest": {"x": "number", "y": "number"}
}

Output Schema

{
  "identified_species": [{
    "mass": "number (amu)",
    "assignment": "string",
    "intensity": "number"
  }],
  "chemical_maps": [{
    "species": "string",
    "image_path": "string"
  }],
  "pca_results": {
    "principal_components": "number",
    "variance_explained": ["number"]
  }
}