UV-Vis-NIR Analyzer
Purpose
The UV-Vis-NIR Analyzer skill provides optical characterization of nanomaterials, enabling analysis of electronic transitions, plasmon resonances, and optical bandgaps essential for photonic and optoelectronic applications.
Capabilities
- Absorption/transmission/reflectance spectra
- Localized surface plasmon resonance (LSPR) analysis
- Bandgap determination (Tauc plot)
- Quantum dot emission characterization
- Beer-Lambert quantification
- Aggregation monitoring
Usage Guidelines
Optical Analysis
- LSPR Analysis
- Monitor peak position and width
- Track sensitivity to environment
- Assess size and shape effects
- Bandgap Determination
- Apply Tauc plot method
- Select direct/indirect transition
- Report with uncertainty
- Concentration Quantification
- Apply Beer-Lambert law
- Verify linear range
- Account for scattering
Process Integration
- Multi-Modal Nanomaterial Characterization Pipeline
- Structure-Property Correlation Analysis
- Nanosensor Development and Validation Pipeline
Input Schema
{
"spectrum_file": "string",
"measurement_type": "absorbance|transmittance|reflectance",
"analysis_type": "lspr|bandgap|concentration",
"material_type": "metal_np|semiconductor|quantum_dot"
}Output Schema
{
"lspr": {
"peak_position": "number (nm)",
"fwhm": "number (nm)",
"extinction_coefficient": "number"
},
"bandgap": {
"value": "number (eV)",
"transition_type": "direct|indirect"
},
"concentration": {
"value": "number",
"unit": "string",
"extinction_used": "number"
}
}